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SEM: Ultra-high vacuum system for SEM

Scanning Electron Microscope

Dimensions
Scanning Electron Microscope
Scanning Electron Microscope
Features
The image of SEM
The image of SEM

This is an ultra-high vacuum system for SEM (Scanning Electron Microscope) to observe the sample's surface topography on the CRT, by scanning the surface with an electron probe and detecting the second electrons generated out of the sample. This is also applied to measure the side length of semiconductor, to inspect the surface, to do mask lithography and so on.

Analyzer

The SEM unit is made by APCO Ltd. ( http://homepage3.nifty.com/APCO/index.html )

Delivery record

RIKEN, National Institute for Materials Science (NIMS)
etc.

Estimate
SEM: Ultra-high vacuum system for SEM
* Our company can design and provide the system according to the customers' specifications. For details, click here to contact us.
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